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Metrology software for the semiconductor industry. Download the evaluation copy of WAFERMAP or PANELMAP. Read, analyze and visualize data files from semiconductor metrology equipment. | |
Keywords : wafermap, panelmap, semiconductor, software, metrology, equipment, IC, LCD, TFT, solar, panel, wafer, wafermap-view.ocx, waferview.ocx, 1D Plot, line scan, 2D Contour Plot, 2D Color Plot, value plot, 3D Color Plot, 3D bar chart, sigma range plot, statisti |
Last Update : | 24/December/2011 |
Google PR : | 3 |
Internal links : | 27 |
Archive : | Check how did the site look in the past? |