| CAMECA: SIMS, NanoSIMS, EPMA, LEXES and Atom Probe instruments for microanalysis | |
| CAMECA manufactures and services high-performance analytical instrumentation for production support, quality monitoring, and basic materials research. | |
| Keywords : Microanalysis, SIMS, EPMA, APT, LEXES, secondary ion mass spectrometry, electron probe microanalysis, atom probe tomography, semiconductor metrology |
| Last Update : | 27/December/2011 |
| Google PR : | 6 |
| Internal links : | 59 |
| External links : | 8 |
| Archive : | Check how did the site look in the past? |